MATRICS Trademark
Serial Number: 79357294 • Registration: 7349522
Trademark Classes
Owner Contact Info
2-10-1 Shin-yokohama
Kohoku-ku, Yokahama 222-8552 , JP
Entity Type: 03
Legal Representation
Correspondence Address
George W. Lewis WHDA, LLP
8500 Leesburg Pike, Ste. 7500
Tysons, VA 22182
UNITED STATES
Trademark Details
Filing Date
September 20, 2022
Registration Date
April 9, 2024
Published for Opposition
January 23, 2024
Goods & Services
Semiconductor photomask optical inspection apparatus; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for semiconductor photomask; semiconductor reticle optical inspection apparatus; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for semiconductor reticle; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for semiconductor photomask blanks; optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; material testing instruments and machines, namely, metal strength testing machines; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for defects of photomasks or reticles; data sets, recorded and downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask or reticles optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask or reticles optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask or reticles optical inspection apparatus
