MPM Trademark
Serial Number: 79392327 • Registration: 7674319
Trademark Classes
Owner Contact Info
2-10-1 Shin-yokohama
Kohoku-ku, Yokahama 222-8552 , JP
Entity Type: 03
Legal Representation
Correspondence Address
George W. Lewis WHDA, LLP
8500 Leesburg Pike, Ste. 7500
Tysons, VA 22182
United States
Trademark Details
Filing Date
January 30, 2024
Registration Date
February 4, 2025
Published for Opposition
December 17, 2024
Goods & Services
Optical inspection apparatus for semi-conductor materials and elements; semiconductor photomask phase-shift measuring apparatus; semiconductor photomask transmittance measuring apparatus; apparatus and instruments for measuring semiconductor photomask phase shifting amounts; semi-conductor testing machines and instruments; electron microscopes; optical semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision measuring apparatus for measuring defects in semiconductor photomasks