ADVANCED SOURCE METROLOGY INSTRUMENT (ASMI) Trademark

Serial Number: 76587120 • Registration: 3124040

ADVANCED SOURCE METROLOGY INSTRUMENT (ASMI) is a trademark filed by LITEL INSTRUMENTS on April 14, 2004. The trademark is classified under Class 9 (Computers & Electronics). The application is currently no longer active.

Trademark Classes

Class 9 - Computers & Electronics

Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments

Owner Contact Info

LITEL INSTRUMENTS (23 trademarks)

San Diego, CA 92126

Entity Type: 03

Trademark Details

Filing Date

April 14, 2004

Registration Date

August 1, 2006

First Use Anywhere

May 1, 1997

First Use in Commerce

January 1, 2000

Published for Opposition

September 6, 2005

Cancellation Date

March 8, 2013

Goods & Services

Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and pinhole cameras located either above or below the reticle plane with corresponding oversized openings in the reticle plane, the whole in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits