HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI). Trademark

Serial Number: 76587121 • Registration: 3124041

HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI). is a trademark filed by LITEL INSTRUMENTS on April 14, 2004. The trademark is classified under Class 9 (Computers & Electronics). The application is currently no longer active.

Trademark Classes

Class 9 - Computers & Electronics

Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments

Owner Contact Info

LITEL INSTRUMENTS (23 trademarks)

San Diego, CA 92126

Entity Type: 03

Trademark Details

Filing Date

April 14, 2004

Registration Date

August 1, 2006

First Use Anywhere

June 1, 2004

First Use in Commerce

September 1, 2004

Published for Opposition

September 13, 2005

Cancellation Date

March 8, 2013

Goods & Services

Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and an in-situ imaging objective with mounting means attached to a framework in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the sufraces of wafers for use in manufacturing of integrated circuits