XENOCS XSACT Trademark

Downloadable and recorded software for analyzing and identifying nanostructures, in particular size, configuration and orientation, or atomic-scale structures of soft matter or nanostructured materials, in particular polymers, surfactants, colloids, nanomaterials, porous materials, liquid crystals; Downloadable and recorded software for identifying characteristic dimensions on the atomic scale, the nanoscale or the mesoscale based on material analysis by means of small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering; Downloadable and recorded software for processing X-ray scattering data collected by means of analyzing small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering, and for visualizing data; Downloadable and recorded software for providing information relating to the size distribution of nanoparticles, relating to the size and configuration of nano-objects or nanoparticles in nanostructured materials, relating to fractal dimensions, relating to the crystalline proportion of semi-crystalline materials; Downloadable and recorded software for analyzing crystalline phases, nanoscale coatings for macromolecules in solutions, including proteins; Downloadable and recorded software for analyzing the orientation of nanostructures in thin films or deformed or stressed materials