Serial Number
75559470
Owner
Helmut Fischer GmbH & Co., Institut Fur Elektronik und MesstechnikAttorney
Daniel S. Kriegsman, Esq.Filing Date
Sep 25, 1998
XDL Trademark
Serial Number: 75559470 • Registration: 2810845
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 41 - Education & Entertainment
Education; providing of training; entertainment; sporting and cultural activities
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Sindelfingen 6 7032 , DE
Entity Type: 11
INDUSTRIESTRASSE 21
SINDELFINGEN D-71069 , DE
Entity Type: 03
Legal Representation
Trademark Details
Filing Date
September 25, 1998
Registration Date
February 3, 2004
Published for Opposition
May 8, 2001
Goods & Services
[ training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein, providing on-line training via a global computer network in the use an operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein ]
Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments; ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto,- opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use [ ultra sound and ]electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments
[ product development for others, computer software consultation for others, technical consultation in the field of scientific, electrical, optical monitoring and measuring apparatuses and instruments and computers and software used therein, providing on-line consultation via a global computer network in the field of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein, computer services, namely, designing and implementing web sites for others ]
