WAFERSCOPE Trademark

LABORATORY AND MANUFACTURING EQUIPMENT FOR USE WITH SEMICONDUCTOR ANALYSIS, NAMELY, MICROSCOPES, IMAGE ANALYZERS AND STRUCTURAL PARTS THEREFOR; SEMICONDUCTOR INTEGRATED CIRCUIT INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBERS OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR; WAFER INSPECTION EQUIPMENT COMPRISED OF COLLECTION OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; SEMICONDUCTOR INTEGRATED CIRCUIT TESTING EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE WAFER TESTING EQUIPMENT COMPRISED OF COLLECTION OPTICS, PHOTONS SENSORS, FIBER OPTICS, AND COMPUTER HARDWARE AND SOFTWARE; COMPUTER HARDWARE AND SOFTWARE FOR SCANNING, IMAGING, INSPECTING DIAGNOSING AND TESTING WAFERS AND SEMICONDUCTOR INTEGRATED CIRCUITS