UNITY SEMICONDUCTOR Trademark
Serial Number: 79379311
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 37 - Building & Construction
Building construction; repair; installation services
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
611 avenue Aristide Bergès
F-38330 MONTBONNOT-SAINT-MARTIN , FR
Entity Type: 34
Legal Representation
Correspondence Address
Jeffrey Goehring Nixon Vanderhye
901 N. Glebe Rd. #1100
Parc Les Algorithmes
ARLINGTON, VA 22203
United States
Trademark Details
Filing Date
August 10, 2023
Registration Date
Not Registered
Goods & Services
Inspection devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization; optical inspection systems, devices and sensors, namely, industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices for imaging, dark field and scattering detection, deflectometry, and fluorescence detection; metrology and dimensional control devices and systems for the semiconductor, micro-optics and micro-electromechanical systems industries, namely, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography imaging devices; optical metrology sensors, devices and systems, namely, sensors, devices, and systems comprised of camera, laser, light source, translation and rotation stage, robots, computer, display screen, and frames
Installation, maintenance and repair of machines, namely industrial imaging devices for imaging semiconductors, optical frequency metrology devices, profilometers, interferometers, and optical coherence tomography devices, for imaging, inspection, thickness layer measurement, surface profile measurement, critical dimensions measurement, overlay measurement, and process control and characterization
Engineering services in the field of semiconductor, micro-optics, and micro-electromechanical systems inspection and metrology
