Serial #86292505 Trademark

Arranging and conducting conferences, colloquiums, congresses, courses, seminars, symposiums, and workshops all for training purposes in the field of microscopy and nanotechnology, specifically in the subject areas of scanning and transmission electron microscopy, ion beam microscopy, ion beam processing techniques, and complex methods combining the forgoing microscopy with Raman microscopy, atomic force microscopy and lasers, and holographic microscopy

Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely, electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron-beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for non-medical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments, namely, diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, microscope software that enhances the navigational and functional capability of microscopic, analytic, lithographic and spectroscopic components separately and in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and in integrated systems, namely, operating software for use in microscopic imaging, milling, deposition and analysis; image processing software

Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal ion sources, and plasma sources; installation, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and instruments for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; installation, maintenance and repair of electron-beam lithography apparatus; installation, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; installation, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; installation, maintenance and repair of lasers for non-medical purposes; installation, maintenance and repair of optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; installation, maintenance and repair of diaphragms for scientific apparatus; installation, maintenance and repair of measuring instruments, namely, micrometer gauges; installation, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, and cathodoluminiscence detectors; installation, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges