Serial Number
79382871
Owner
Skyverse Technology Co., LtdAttorney
Tim O'KeeffeFiling Date
Oct 9, 2023
Serial #79382871 Trademark
Serial Number: 79382871 • Registration: 7821200
Trademark Classes
Owner Contact Info
No. 101,102, No. 1301-14, Guanguang Road,
Entity Type: 99
Legal Representation
Correspondence Address
Tim O'Keeffe Bayramoglu Law Offices LLC
1540 West Warm Springs Road, Suite 100
No. 6008 Shennan Avenue, Shenzhen
Henderson, NV 89014
United States
Trademark Details
Filing Date
October 9, 2023
Registration Date
June 10, 2025
Published for Opposition
April 22, 2025
Goods & Services
Material testing; installation of computer software; computer software design; maintenance of computer software; technological research in the field of semiconductor testing, measuring, and inspecting; conducting technical project studies, namely yield and defect systems studies in the field of semiconductor testing, measuring, and inspecting; scientific laboratory services; research and development of new products for others; information technology (IT) support services, namely troubleshooting of computer software problems; semiconductor wafer quality testing
Computer programs, recorded, for use in the inspection and measurement of semiconductor wafers; computer software, recorded, for use in the inspection and measurement of semiconductor wafers; precision measuring apparatus, namely, optical inspection apparatus for inspecting and measuring quality parameters for semiconductor wafers, overlay metrology, and film metrology; measuring instruments, namely, optical inspection instruments for inspecting and measuring quality parameters for semiconductor wafers, overlay metrology, and film metrology; Detectors, namely, defect detectors for semiconductor wafers; measuring apparatus, namely, laser measuring apparatus for systems inspecting and measuring semiconductor wafers, overlay metrology, and film metrology; surveying apparatus and instruments; semi-conductors; video screens; optical apparatus and instruments, namely, apparatus and instruments for inspecting and measuring quality parameters for semiconductor systems, overlay metrology, and film metrology; optical lenses
