Serial Number
76141484
Owner
TEST ADVANTAGE HARDWARE, LLCAttorney
Patrice P. JeanFiling Date
Oct 5, 2000
TEST ADVANTAGE Trademark
Serial Number: 76141484 • Registration: 2921023
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Class 35 - Advertising & Business
Advertising; business management; business administration; office functions
Owner Contact Info
Legal Representation
Correspondence Address
Patrice P. Jean Hughes Hubbard & Reed LLP
One Battery Park Plaza
New York, NY 10004
UNITED STATES
Trademark Details
Filing Date
October 5, 2000
Registration Date
January 25, 2005
Published for Opposition
February 18, 2003
Cancellation Date
August 8, 2025
Goods & Services
[ Semiconductor testing and manufacturing solutions, namely, automated test equipment (ATE) computer software development tools [ and computer hardware ] for use by semiconductor test and manufacturing professionals; computer software for operation of semiconductor automated test equipment ]
Retailing, namely, second-hand retailing of semiconductor automated test equipment
Providing semiconductor test solutions, namely, [ semiconductor testing; configuring, namely, ] technical consultation in the field of semiconductor automated test equipment, engineering services in the field of semiconductor automated test equipment, verifying semiconductor automated test equipment for others, customizing semiconductor automated test equipment; and research and development for new products in the field of semiconductor automated test equipment software for others; testing semiconductor automated test equipment software for others; converting semiconductor automated test equipment software for others; [ designing semiconductor automated test equipment software for others; customizing semiconductor automated test equipment software for others; ] and technical consultation in the field of semiconductor automated test equipment software