SEMILAB Trademark
Serial Number: 79386765 • Registration: 7846386
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 37 - Building & Construction
Building construction; repair; installation services
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Legal Representation
Correspondence Address
Timur Slonim Law Office of Timur E. Slonim, Esq.
86 Reno Ave
Staten Island, NY 10306
United States
Trademark Details
Filing Date
February 16, 2023
Registration Date
July 1, 2025
Published for Opposition
May 13, 2025
Goods & Services
Servicing and maintenance of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures
Optical and electrical measuring devices, namely, semiconductor testing apparatus and scientific instruments for the inspection of semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures, for determining their physical and chemical properties, namely, layer thickness, hardness, dopant and/or contaminant concentration and electrical conductivity, and for detecting surface irregularities, crystal defects and manufacturing defects, and components of said optical and electrical measuring devices, namely, sensor heads, AFM tips, optical assemblies, electronic assemblies, covering elements; downloadable software for controlling measuring devices, evaluating the measurement results, performing related simulations and controlling manufacturing processes.
Scientific testing services, namely, carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; product design and development of devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; quality control and authentication services for others related to devices suitable for carrying out optical or electrical measurements on semiconductor blocks, semiconductor wafers, semi-finished products of the semiconductor industry, thin-film structures and other microstructures; design, development and testing of software for controlling measuring devices, evaluating the produced measurement results, performing related simulations and controlling manufacturing processes
