Serial Number
79385845
Owner
QureDA Research, Inc.Attorney
Randolph E. Digges, IIIFiling Date
Sep 20, 2023
QUREDA RESEARCH Trademark
Serial Number: 79385845 • Registration: 7636886
Trademark Classes
Class 7 - Machinery
Machines and machine tools; motors and engines; machine coupling and transmission components
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 40 - Treatment & Processing
Treatment of materials
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Legal Representation
Correspondence Address
Randolph E. Digges, III Rankin, Hill & Clark LLP
P.O. Box 1150
8F, Queen's Tower A,
Bonita Springs, FL 34133-1150
United States
Trademark Details
Filing Date
September 20, 2023
Registration Date
January 7, 2025
Published for Opposition
September 17, 2024
Goods & Services
Semiconductor substrates manufacturing machines; crucibles as parts and accessories of semiconductor substrates manufacturing machines; semiconductor wafer processing equipment; crucibles as parts and accessories of semiconductor wafer processing equipment; semiconductor manufacturing machines; crucibles as parts and accessories of semiconductor manufacturing machines
Custom manufacture of semiconductors; providing information relating to custom manufacture of semiconductors; consultancy relating to custom manufacture of semiconductors; custom manufacture of semiconductor wafers; providing information relating to custom manufacture of semiconductor wafers; consultancy relating to custom manufacture of semiconductor wafers; metal treating
Semiconductors; semiconductor wafers; computers; computer peripherals; data processing apparatus; data carriers recorded with computer programs for testing semiconductors and semiconductor wafers; nondestructive testing equipment using electromagnetic wave, namely, semiconductor and semiconductor wafers testing apparatus; semiconductor wafers testing apparatus; semiconductor testing apparatus; surface inspecting apparatus for testing semiconductors and semiconductor wafers; shape measuring apparatus for measuring semiconductors and semiconductor wafers; instruments for measuring length; thickness measuring apparatus; coordinate measuring apparatus; material testing machines for testing semiconductors and semiconductor wafers; photometers; polarimeters; optical profilers; industrial X-ray apparatus; X-ray fluorescence analyzers; electron microscopes; cinematographic machines and apparatus; optical instruments for use in inspection and measurement of semiconductor wafer; microscopes; spectroscopes; electric meters; magnetometers; power controllers; electric power distribution machines
Research in the field of semiconductor processing technology; research in the field of semiconductor wafers processing technology; development, testing, inspection or research of semiconductors, namely, research and testing in the area of semiconductor processing technology; development, testing, inspection or research of semiconductor wafers, namely, research and testing in the area of semiconductor wafer processing technology; testing or research on electricity; testing or research services relating to machines, apparatus and instruments, namely, testing the functionality of machines; design of semiconductor and semiconductor manufacturing machines; design of semiconductor wafer and semiconductor wafer manufacturing machines; technical advice relating to operation of semiconductor manufacturing machines being technical advice in relation to the operation of computers used in manufacturing semiconductors; technical advice relating to operation of semiconductor wafer manufacturing machines being technical advice in relation to the operation of computers used in manufacturing semiconductor wafers; design of semiconductor testing apparatus; design of semiconductor wafer testing apparatus; technical advice relating to operation of semiconductor testing apparatus being technical advice in relation to the operation of computers used in testing semiconductors; technical advice relating to operation of semiconductor wafer testing apparatus being technical advice in relation to the operation of computers used in testing semiconductor wafers; design of industrial machines