QUATERNITY Trademark

Probes for scientific purposes and for use in the measurement and testing of semiconductors; Probe cards for semiconductor testing; Probe cards for integrated circuit testing; Probes for testing integrated circuits; Microscopes

Product research and development; Technological research in the field of microscopy; Engineering services in the field of microscopy, probes and probe cards, namely, technical project planning and engineering design services in the field of microscopy, probes, and probe cards; Technical writing; Scientific analysis of the measurements of semiconductor components; Scientific analysis of the measurements of integrated circuits; Scientific analysis of the measurements of electronic components; Scientific analysis of the measurements of microelectronic components; Scientific analysis of the measurements of nano electronic components; Scientific analysis of the measurements of angstrom electronic components; Scientific analysis of the measurements of passive and active electronic components; Integrated circuit testing and analysis service for scientific research purposes; Scientific analysis of the measurements of very-large-scale integrated circuits; Electronic components testing and analysis service for scientific research purposes; Research in the area of semiconductor processing technology; Research in the field of physics; Chemical analysis; Chemical research; Material testing and analysis