PUROVIEW Trademark

Providing on-line non-downloadable software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing on-line non-downloadable software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Providing on-line non-downloadable software for optimizing contamination control in semiconductor device manufacturing; Providing on-line non-downloadable software for use in connection with machines for contamination control in semiconductor device manufacturing; Providing on-line non-downloadable software for use in semiconductor device manufacturing; Providing on-line non-downloadable software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing

Machines for contamination control in semiconductor device manufacturing with integrated recorded software for optimizing contamination control, sold as a unit; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for controlling the machines, sold as a unit; Machines for cleaning wafer carriers; Machines for semiconductor device manufacturing with integrated recorded operating system software, sold as a unit; Filters and purifiers for machines, namely, filters and purifiers for removing contaminants from gases used in the semiconductor industry; Semiconductor wafer processing machines using sensors to detect impurities, defects and/or contamination in wafer carriers or wafer carrier systems; Machines for cleaning reticle carriers; Semiconductor substrate manufacturing machines; Machines for contamination control in semiconductor device manufacturing; Machines for cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing with integrated recorded software for optimizing cleaning of wafer carriers and reticle carriers, sold as a unit; Semiconductor wafer processing machines; Machines for inspecting reticle carriers; Semiconductor manufacturing machines; Machines for contamination control in semiconductor device manufacturing with integrated recorded software for analyzing data, sold as a unit; Semiconductor reticle processing machines; Machines for manufacturing semiconductors; Machines for semiconductor device manufacturing; Machines for inspecting wafer carriers; Semiconductor reticle processing machines using sensor systems to detect impurities, defects and/or contamination in reticle carriers or systems

Downloadable and recorded software for optimizing cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for optimizing contamination control in semiconductor device manufacturing; Downloadable and recorded software for controlling machines for contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing; Downloadable and recorded software for use in connection with machines for contamination control in semiconductor device manufacturing; Downloadable and recorded software for use in semiconductor device manufacturing; Downloadable and recorded software for analyzing data related to contamination control and cleaning of wafer carriers and reticle carriers in semiconductor device manufacturing