Serial Number
88949809
Owner
MEO Engineering Company, Inc.Attorney
Roman FayerbergFirst Use Date
Nov 15, 2005
Filing Date
Jun 5, 2020
PBS&T Trademark
Serial Number: 88949809 • Registration: 6451569
Trademark Classes
Class 1 - Chemicals
Chemical products for industry, science, photography, agriculture, horticulture and forestry
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 41 - Education & Entertainment
Education; providing of training; entertainment; sporting and cultural activities
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
290 Broadway St., Suite 298
Methuen, MA 01844
Entity Type: 03
Legal Representation
Correspondence Address
Roman Fayerberg GREENBERG TRAURIG LLP
ONE INTERNATIONAL PLACE, SUITE 2000
BOSTON, MA 02110
UNITED STATES
Trademark Details
Filing Date
June 5, 2020
Registration Date
August 17, 2021
First Use Anywhere
November 15, 2005
First Use in Commerce
November 15, 2005
Published for Opposition
June 1, 2021
Goods & Services
Providing training services related to laboratory equipment, namely, particle beam instrumentation
Scientific instrumentation, parts, consumables, components, and accessories for analysis and processing of materials, namely, components for focused ion beam (FIB) systems and electron microscopy systems in the nature of extractors, suppressors, shields, filaments, apertures, and aperture strips; Laboratory equipment in the nature of replacement parts and consumables for particle beam instrumentation, namely, focused ion beam (FIB) systems and electron microscopy systems
Scientific laboratory services; Providing consulting and support services related to laboratory equipment, namely, particle beam instrumentation; Scientific laboratory services related to particle beam instrumentation, namely, focused ion beam (FIB) systems and electron microscopy
Scientific consumables in the nature of a wide variety of chemicals used in focused ion beam (FIB) systems and electron microscopy systems