PANALYTICAL Trademark
Serial Number: 76391600 • Registration: 3029656
Trademark Classes
Owner Contact Info
Legal Representation
Correspondence Address
Erik N. Lund Whitestone Law PLLC
8000 Westpark Drive. Suite 250
McLean, VA 22102
United States
Trademark Details
Filing Date
April 4, 2002
Registration Date
December 13, 2005
Published for Opposition
July 1, 2003
Goods & Services
Analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for the cement, steel, aluminum, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for both silicon and compound semiconductor applications, x-ray fluorescence wafer and disc analyzers [ and automated ellipsometers ] for the silicon semiconductor industry, for analyzing film thickness, composition and density; x-ray diffraction, namely, x-ray diffraction meters for the compound semiconductor industry; x-ray tubes, not for medical purposes; operating software for industrial process control and for research and development applications
