OPENSTAR
DEAD

Serial Number

78161397

Owner

SEMICONDUCTOR TEST CONSORTIUM, INC.

Attorney

ROBIN S BREN

Filing Date

Sep 6, 2002

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OPENSTAR Trademark

Serial Number: 78161397 • Registration: 2888848

OPENSTAR is a trademark filed by SEMICONDUCTOR TEST CONSORTIUM, INC. on September 6, 2002. The trademark is classified under Class 7 (Machinery), Class 9 (Computers & Electronics), Class 37 (Building & Construction), Class 42 (Computer & Scientific). The application is currently no longer active.

Owner Contact Info

SEMICONDUCTOR TEST CONSORTIUM, INC. (3 trademarks)

2515 CAMINO DEL RIO SOUTH, SUITE 340
SAN DIEGO, CA 92108

Entity Type: 03

ADVANTEST CORPORATION (85 trademarks)

TOKYO 100-0005 , JP

Entity Type: 03

Trademark Details

Filing Date

September 6, 2002

Registration Date

September 28, 2004

Published for Opposition

March 9, 2004

Cancellation Date

April 29, 2011

Goods & Services

Measuring or testing machines and instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of temperature and multifunctional equipment and apparatus for use in measuring, analyzing and diagnosis both of temperature and electronic signals in the fields of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof, especially, Multi-channel Digital Recorder, namely, temperature indicators incorporating voltmeter; electronic and magnetic measuring and testing instruments, namely, equipment and apparatus for use in measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, namely, current, voltage, impedance, frequency in the field of manufacturing or testing integrated circuits, large integrated circuits, other integrated circuits device, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof, namely, digital [ multi meters ] *multimeters* equipped with DC voltage/Current Generators, spectrum analyzers, network analyzers, optical spectrum analyzers, optical network analyzers, optical time domain [ reflect meters ] *reflectmeters*, frequency counters in the nature of meters and testers for measuring, analyzing and diagnosis of electronic signals, optical signals and fundamental quantity of electricity, pulse pattern generators, error detectors, protocol analyzers, digital spectrum analyzers, Bluetooth testers, namely, radio communication testers for use in the analyzing and testing of radio communications comprised of primarily mainframe consisting of display and optical units, connecting cables, emitters, detectors, transceiver modules, wave-form distortion analyzers, ratio meters, wave-noise figure meters, electronic instruments for testing bit error rates, and laser diode test systems, namely, meters and testers for use in the analyzing and testing of laser beam comprised of primarily mainframe consisting of display and optical units, light source for probe signal, and connecting cables, emitters, detectors, wave-form distortion analyzers, ratio meters, wave-noise figure meters, and electronic instruments for testing bit error rates; electronic machines and apparatus equipped with test handler for use in measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices in the field of manufacturing or testing the foregoing, especially, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beam Test System; computer software for testing, measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof used in connection with applied electronic machines and apparatus, namely, LSI (Large Scale Integrated circuits) and VLSI (Very Large Scale Integrated Circuits) Test System, SoC (System on a Chip) Test System, Memory Test System, Logic Test System, Flash memory Test System, RFIC (Radio Frequency Integrated circuits) Test System, Mixed-signal Test System, LCD (Liquid Crystal Display Driver) Test System, Imagesensor Test System, E-beam Test System; computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for testing, measuring, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; pre-recorded video discs and video tapes featuring information in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof; electronic publications and downloadable publications in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and electronic components and assemblies composed thereof

Semiconductor manufacturing machines and systems; starters for motors and engines; AC motors and DC motors not including those for land vehicles; AC generators, DC generators, Dynamo brushes

Installation, electrical wiring services of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for use in testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and other construction; repair and maintenance of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; repair and maintenance of semiconductor manufacturing machines and systems; repair and maintenance of telecommunication machines and apparatus

Technical consultation in the fields of installation of electrical works of measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for use in testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices and other construction; computer software design and maintenance for software for use with testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof in the fields of manufacturing and testing the foregoing; technical consultation in the field of computers and telecommunications relating to performance and operation of computers and other machines that require high levels of personal knowledge, skill or experience of the operators to meet the required accuracy in operating them for use in manufacturing and testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof; testing and research on measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; rental and leasing services for semiconductor manufacturing machines and systems; rental and leasing services for measuring or testing machines and systems; rental and leasing services for measuring or testing machines and instruments, electronic and magnetic measuring and testing instruments, electronic machines and apparatus for testing, analyzing and diagnosis of integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices; rental and leasing services for computers, including computer software recorded on magnetic, electromagnetic, and optical data carriers, namely, tapes, discs and chips for use in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electric components and electronic assemblies composed thereof; preparation of computer software operating manuals for others in the fields of manufacturing and testing integrated circuits, large integrated circuits, other integrated circuit devices, semiconductor elements, other semiconductor devices, electronic components and electronic assemblies composed thereof

Filing History

CANCELLED SEC. 8 (6-YR)
Apr 29, 2011 C8..
AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP
Oct 28, 2009 ASGN
AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP
Oct 21, 2009 ASGN
CORRECTION UNDER SECTION 7 - PROCESSED
Dec 7, 2004 COC.
PAPER RECEIVED
Oct 21, 2004 MAIL
REGISTERED-PRINCIPAL REGISTER
Sep 28, 2004 R.PR
Sec. 1(B) CLAIM DELETED
Jul 29, 2004 1.BD
NOTICE OF ALLOWANCE CANCELLED
Jul 29, 2004 IUCN
PAPER RECEIVED
Jul 29, 2004 MAIL
NOA MAILED - SOU REQUIRED FROM APPLICANT
Jun 1, 2004 NOAM
PUBLISHED FOR OPPOSITION
Mar 9, 2004 PUBO
NOTICE OF PUBLICATION
Feb 18, 2004 NPUB
APPROVED FOR PUB - PRINCIPAL REGISTER
Dec 31, 2003 CNSA
CORRESPONDENCE RECEIVED IN LAW OFFICE
Dec 2, 2003 CRFA
PAPER RECEIVED
Dec 2, 2003 MAIL
LETTER OF SUSPENSION MAILED
Oct 6, 2003 CNSL
CASE FILE IN TICRS
Sep 15, 2003 CFIT
CORRESPONDENCE RECEIVED IN LAW OFFICE
Aug 25, 2003 CRFA
PAPER RECEIVED
Aug 25, 2003 MAIL
NON-FINAL ACTION E-MAILED
Feb 24, 2003 GNRT
ASSIGNED TO EXAMINER
Feb 24, 2003 DOCK
PAPER RECEIVED
Nov 29, 2002 MAIL