Serial Number
79282521
Owner
attocube systems GmbHAttorney
Scott D. WoldowFiling Date
Nov 29, 2019
NEA Trademark
Serial Number: 79282521 • Registration: 6337288
Trademark Classes
Owner Contact Info
Legal Representation
Correspondence Address
Scott D. Woldow Smith, Gambrell & Russell, LLP
1055 Thomas Jefferson Street, NW
Suite 400
Washington, DC 20007
United States
Trademark Details
Filing Date
November 29, 2019
Registration Date
May 4, 2021
Published for Opposition
February 16, 2021
Goods & Services
Precision positioning systems comprised of precision instruments for manipulation and positioning of microscopic objects, in particular with piezo drives as parts of control and measuring instruments; Adjusting and positioning systems comprised of precision instruments for manipulation and positioning of microscopic objects, in particular with piezo drives as parts of control and measuring instruments; electrically controlled mechanical adjusting devices in the form of control and regulation units, namely, control units for regulating microscopes, and electron microscopes; control and regulation units, namely, apparatus and instruments for conveying, distributing, transforming, storing, regulating or controlling electric current for adjusting devices, micropositioning tables, in particular for optical waveguides and fiber optics; microscope parts, namely, apparatus for moving mirrors in microscopes; control apparatus for microscopes, namely, microscope parts for scanning atomic force microscopes, magnetic force microscopes, laser scanning microscopes and scanning electron microscopes; measuring instruments for measuring the scale of microscopic particles, in particular electronic and electronic optical measuring apparatus; precision measuring apparatus for measuring the scale of microscopic particles; distance measuring apparatus, in particular integrated path sensors for mechanical positioning systems; interferometric optical sensors; microscopes, precision microscopes, in particular for use at low temperatures; magnetic force microscopes; atomic force microscopes; laser scanning microscopes; scanning electron microscopes (SEM); scanning near field microscopes; microscope and spectrometer parts, namely, detection modules for microscopes and spectrometers; microscope and spectrometer parts, namely, illuminations for microscopes and spectrometers; spectrometers; observation instruments, namely, apparatus for transmitting and reproducing nanoscale images; non-medical imaging devices for nanoscale imaging; optical apparatus and instruments, in particular optical sensors; surface measuring apparatus being optoelectronic and operating without contact, namely, optical readers and optical imaging readers; cryostats for laboratory use; downloadable computer software for nanoscale imagery, in particular for operating, adjusting and positioning systems in the field of nanoscale analytics