NANOUDI Trademark
Serial Number: 76442279
Trademark Classes
Owner Contact Info
Legal Representation
Trademark Details
Filing Date
August 20, 2002
Registration Date
Not Registered
Published for Opposition
April 15, 2003
Goods & Services
Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate