NANOGEOMETRY Trademark
Serial Number: 76423952 • Registration: 2971456
Trademark Classes
Owner Contact Info
2-6-23 Shin-Yokohama, Kohoku-ku
Yokohama, Kanagawa 222-0033 , JP
Entity Type: 03
3-2-1 Sakado Takatsu-Ku Kawasaki-shi
Kanagawa , JP
Entity Type: 03
Legal Representation
Correspondence Address
Jonathan Agmon Soroker Agmon Nordman
111 Somerset Road, #09-14
Singapore, 238164
SINGAPORE
Trademark Details
Filing Date
June 19, 2002
Registration Date
July 19, 2005
Published for Opposition
April 6, 2004
Goods & Services
SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES