MMX
LIVE

Serial Number

98446808

Owner

Mycronic AB

Attorney

Maurine Knutsson

Filing Date

Mar 13, 2024

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MMX Trademark

Serial Number: 98446808

MMX is a trademark filed by Mycronic AB on March 13, 2024. The trademark is classified under Class 7 (Machinery), Class 9 (Computers & Electronics), Class 37 (Building & Construction), Class 42 (Computer & Scientific). The application is currently pending registration.

Owner Contact Info

Mycronic AB

Nytorpsvägen 9
Täby 18303 , SE

Entity Type: 99

Trademark Details

Filing Date

March 13, 2024

Registration Date

Not Registered

Published for Opposition

January 20, 2026

Goods & Services

installation services for machines, apparatus, systems and instruments that are used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; installation services for of semiconductor manufacturing machines and systems; repair and maintenance of machines, apparatus, systems and instruments that are used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; repair or maintenance of semiconductor manufacturing machines and systems; providing information relating to the repair or maintenance of semiconductor manufacturing machines and systems

design, engineering, research, and development of photomasks, screens, semiconductors, circuit boards, and computer chips; testing the functionality of photomasks, screens, semiconductors, circuit boards, and computer chips; design, engineering, research, development, and testing services in the field of manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; scientific and technological services, namely, design, engineering, research, and development of machines, apparatus, and instruments used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; testing the functionality of machines, apparatus, and instruments used in the manufacturing of photomasks, screens, semiconductors, circuit boards, and computer chips; design, engineering, research, and development of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; testing the functionality of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; technical advice, information, and consultancy in relation to the design and development of photomasks, screens, semiconductors, circuit boards, and computer chips; technical advice, information, and consultancy in relation to the design and development of machines, apparatus, and instruments used in the production of photomasks, screens, semiconductors, circuit boards, and computer chips; technical advice, information and consultancy in relation to the design and development of data paths for pattern converters and systems for performing advanced processing operations on electronic pattern data and design; design and development of computer software; design and development of computer hardware; product research and development; quality control services being quality control for others; quality management services, namely, quality control in the field of photomasks; quality management services, namely, quality control and testing in the fields of photomasks, screens, semiconductors, circuit boards, and computer chips; testing of semiconductors and photomasks; product testing; product quality testing; quality control for others; quality control of goods and services; providing online non-downloadable computer software used for measuring, inspecting, monitoring, detecting, testing and quality control of photomasks; installation, maintenance and repair of computer software

machines and machine tools for use in the manufacturing of semiconductors, semiconductor circuits, semiconductor chips, semiconductor wafers, semiconductor discs, computer chips, screens, and monitors, and structural parts thereof; components for machine and machine tools, namely, slit valves, wafer handlers, motion feedthroughs, orientors, actuators, gas lines, gate valves, connectors, beam lines, flexible couplings, lifters, leak detectors, XYZ manipulators, valve stem seals, torque couplings, ultra-high vacuum systems, and pressure transducers for use in the manufacturing of semiconductors, semiconductor circuits, semiconductor chips, semiconductor wafers, semiconductor discs, computer chips, screens, and monitors, and structural parts thereof; machines and machine tools for use in the manufacturing of photomasks, substrates, photomask substrates, circuit boards, printed circuit boards, solar cells, and display screens, and structural parts thereof; components for machine and machine tools, namely, slit valves, wafer handlers, motion feedthroughs, orientors, actuators, gas lines, gate valves, connectors, beam lines, flexible couplings, lifters, leak detectors, XYZ manipulators, valve stem seals, torque couplings, ultra-high vacuum systems, and pressure transducers for use in the manufacturing of photomasks, substrates, photomask substrates, circuit boards, printed circuit boards, solar cells, and display screens, and parts thereof

pattern converters and systems performing advanced processing operations on electronic pattern data paths, namely, data processors, calculating machines, data processing equipment and computers, and apparatus and instruments for recording, transmitting, reproducing or processing sound, images or data in the semiconductor industry; data processing apparatus and equipment; calculating machines, data processing equipment and computers; laser equipment and laser measuring systems for measuring and inspecting photomasks, substrates, semiconductor discs, semiconductor wafers, circuit boards, printed circuit boards, photocells, photovoltaics cells, and glass panels for display screen; camera-based measuring system that measures the placement of the structure of the photomask; optical sensors; measuring apparatus and instruments, namely, measuring lasers and optical inspection apparatus for use during production of photomasks for displays and semiconductors; measuring devices, namely, lasers for measuring; electric sensors; testing apparatus and instruments, namely, measuring lasers and optical inspection apparatus for use during production of photomasks for displays and semiconductors; testing apparatus, namely, optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; testing and quality control devices in the nature of scientific apparatus, namely, sensing and signaling devices for measurement and quality control of materials processing by laser; optical inspection apparatus and instruments for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; optical apparatus and instruments, namely, optical sensors, optical frequency metrology devices, optical semiconductors, optical disk drives, optical code readers, optical inspection apparatus, and optical profilers; optical inspection apparatus for industrial use; optical frequency metrology devices; downloadable and recorded computer software for use in measuring, inspecting, monitoring, detecting, testing and quality control of photomasks

Filing History

NOA E-MAILED - SOU REQUIRED FROM APPLICANT
Mar 17, 2026 NOAM
OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Jan 20, 2026 NPUB
PUBLISHED FOR OPPOSITION
Jan 20, 2026 PUBO
NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Jan 14, 2026 NONP
APPROVED FOR PUB - PRINCIPAL REGISTER
Dec 18, 2025 CNSA
TEAS/EMAIL CORRESPONDENCE ENTERED
Oct 24, 2025 TEME
CORRESPONDENCE RECEIVED IN LAW OFFICE
Oct 24, 2025 CRFA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
Oct 24, 2025 TROA
NOTIFICATION OF NON-FINAL ACTION E-MAILED
Jul 29, 2025 GNRN
NON-FINAL ACTION E-MAILED
Jul 29, 2025 GNRT
NON-FINAL ACTION WRITTEN
Jul 29, 2025 CNRT
TEAS/EMAIL CORRESPONDENCE ENTERED
Jun 5, 2025 TEME
CORRESPONDENCE RECEIVED IN LAW OFFICE
Jun 5, 2025 CRFA
TEAS REQUEST FOR RECONSIDERATION RECEIVED
Jun 5, 2025 ERFR
NOTIFICATION OF FINAL REFUSAL EMAILED
Mar 6, 2025 GNFN
FINAL REFUSAL E-MAILED
Mar 6, 2025 GNFR
FINAL REFUSAL WRITTEN
Mar 6, 2025 CNFR
TEAS/EMAIL CORRESPONDENCE ENTERED
Jan 29, 2025 TEME
CORRESPONDENCE RECEIVED IN LAW OFFICE
Jan 29, 2025 CRFA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
Jan 29, 2025 TROA
NOTIFICATION OF NON-FINAL ACTION E-MAILED
Oct 29, 2024 GNRN
NON-FINAL ACTION E-MAILED
Oct 29, 2024 GNRT
NON-FINAL ACTION WRITTEN
Oct 29, 2024 CNRT
ASSIGNED TO EXAMINER
Sep 24, 2024 DOCK
NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
Aug 4, 2024 NWOS
NEW APPLICATION ENTERED
Mar 13, 2024 NWAP