Serial Number
79168629
Owner
KABUSHIKI KAISHA NIHON MICRONICSAttorney
LEIGH ANN LINDQUISTFiling Date
Jun 23, 2014
MJC Trademark
Serial Number: 79168629 • Registration: 5070509
Trademark Classes
Class 7 - Machinery
Machines and machine tools; motors and engines; machine coupling and transmission components
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 37 - Building & Construction
Building construction; repair; installation services
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Legal Representation
Correspondence Address
LEIGH ANN LINDQUIST SUGHRUE MION, PLLC
2000 PENNSYLVANIA AVENUE NW, SUITE 9000
WASHINGTON, DC 20006
UNITED STATES
Trademark Details
Filing Date
June 23, 2014
Registration Date
November 1, 2016
Published for Opposition
August 16, 2016
Goods & Services
Repair and maintenance of electronic machines and apparatus; [ repair and maintenance of telecommunication machines and apparatus; installation, repair and maintenance of solar batteries; installation, maintenance and repair of electric batteries; installation, maintenance and repair of electric accumulators; ] repair and maintenance of probe cards for use in inspection of semi-conductors; [ repair and maintenance of apparatus for inspection of probe cards; ] repair and maintenance of apparatus for inspection of electrical characteristics of semi-conductors; repair and maintenance of apparatus for measuring integrated circuits; [ repair and maintenance of apparatus for inspecting liquid crystal display panels; ] repair and maintenance of measuring and testing machines and instruments [ ; repair and maintenance of electric or magnetic meters and testers ]
[ design and development of computer programs designed to the specifications of others ]
[ Probe cards for use in inspection of liquid crystal panels; apparatus for measuring the electrical properties of liquid crystal display panels; ] Electric contacts for measuring or testing machines and instruments; [ testing machines for integrated circuits; testing machines for flat panel displays; ] probe cards for use in testing of integrated circuits or flat panel displays; [ batteries, electric; accumulators, electric; batteries and cells; equipment for inspection of electrical characteristics of solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in appearance inspection of wafers for solar batteries and cells for solar batteries; measuring or testing machines and instruments for use in inspection of solar batteries; ] probe cards for use in inspection of semi-conductors; [ probe cards for use in inspection of liquid crystal display panels; ] testing apparatus for testing of electrical characteristics of semi-conductors; semiconductor wafer probers; [ semiconductor testing apparatus comprising a master controller computer and a mass interconnect connector interface for connection to a plurality of test instruments for testing electrical characteristics of semi-conductors and measuring semiconductor integrated circuits; ] liquid crystal display testing equipment, namely, automated optical inspection (AOI) systems comprised of an automated camera and computerized controller connected to the camera, probe units, blade-type probes, film type probes, manual probers for organic light-emitting diodes (OLEDs), and lighting units for light-up testing for OLEDs
[ machines for manufacturing solar batteries ]
