M QAID QUATERNITY DESIGN Trademark

Instruments, namely, electrical signal testing and monitoring instruments for observation of semiconductors and integrated circuits; Apparatus and instruments, namely, electrical signal testing and monitoring instruments for physics and semiconductor research; Semiconductor chips; Semiconductors; Integrated Circuit (IC) substrate, namely a printed circuit board (PCB) designed for holding and connecting integrated circuits or computer chips; Integrated circuits; Semiconductor components in the nature of semiconductors, semiconductor memory units, semiconductor chip sets, semiconductor power elements and semiconductor integrated circuits; Semiconductor wafers; Wafers for integrated circuits; Semiconductor devices; Probes for testing and analyzing semiconductors and integrated circuits; Probes for scientific purpose; Apparatus for point contact testing of semiconductor wafers, chip sets, packaged devices, and integrated circuits using probe tips; Integrated circuit tester; Probe cards for scientific purposes and for use in the measurement and testing of semiconductors; Probe cards for semiconductor testing; Probe cards for wafer testing; Interface cards for integrated circuits and semiconductor testing; Very large scale integration (VLSI) integrated circuits; Microscopes