Serial Number
79074422
Owner
SPECS Gesellschaft für; Oberflächenanalytik und; Computertechnologie mbHAttorney
Leo M. LoughlinFiling Date
Aug 7, 2009
KOLIBRI Trademark
Serial Number: 79074422 • Registration: 4561722
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 41 - Education & Entertainment
Education; providing of training; entertainment; sporting and cultural activities
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Voltastr. 5
13355 Berlin , DE
Entity Type: 99
Legal Representation
Correspondence Address
Leo M. Loughlin Rothwell, Figg, Ernst & Manbeck, pc
901 New York Avenue, N.W.
Suite 900 East
Washington, DC 20001
United States
Trademark Details
Filing Date
August 7, 2009
Registration Date
July 8, 2014
Published for Opposition
April 22, 2014
Cancellation Date
September 26, 2025
Goods & Services
SCIENTIFIC AND TECHNOLOGICAL SERVICES, NAMELY, SCIENTIFIC RESEARCH, SCIENTIFIC ANALYSIS AND RESEARCH AND DESIGN RELATING THERETO IN THE FIELD OF SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES, AND IN THE FIELD OF COMPUTER HARDWARE AND SOFTWARE FOR SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; INDUSTRIAL ANALYSIS AND RESEARCH SERVICES IN THE FIELD OF SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES, AND IN THE FIELD OF COMPUTER HARDWARE AND SOFTWARE FOR SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; RESEARCH IN THE FIELD OF TECHNOLOGY, NAMELY, THE FIELD OF MICROSCOPY, IN PARTICULAR IN THE FIELD OF SCANNING PROBE MICROSCOPY [; DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE, IN PARTICULAR DESIGN AND DEVELOPMENT OF COMPUTER HARDWARE AND SOFTWARE FOR TRANSMITTING, PROCESSING, EDITING, AND ANALYZING OF DATA, AND DESIGN AND DEVELOPMENT OF COMPUTER PROGRAMS FOR CONTROLLING SCIENTIFIC APPARATUS AND INSTRUMENTS; UPDATING OF COMPUTER SOFTWARE, IN PARTICULAR UPDATING OF COMPUTER SOFTWARE FOR TRANSMITTING, PROCESSING, EDITING, AND ANALYZING OF DATA AND UPDATING OF COMPUTER SOFTWARE FOR CONTROLLING SCIENTIFIC APPARATUS AND INSTRUMENTS; ENGINEERING AND SERVICES IN THE FIELD OF PHYSICS, NAMELY, DESIGN AND DEVELOPMENT OF SCANNING PROBE MICROSCOPES; TECHNICAL PROJECT PLANNING IN THE FIELD OF DESIGNING AND DEVELOPING SCANNING PROBE MICROSCOPES, AND IN THE FIELD OF CONFIGURATION AND IMPLEMENTATION OF HARDWARE AND SOFTWARE FOR SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES]
[EDUCATIONAL SERVICES IN THE NATURE OF ARRANGING AND CONDUCTING SEMINARS AND WORKSHOPS IN THE FIELD OF HANDLING AND OPERATING SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; TRAINING ADVICE IN THE FIELD OF HANDLING AND OPERATING SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES]
SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; MEASURING APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES, ACCESSORY PARTS FOR SCIENTIFIC APPARATUS AND INSTRUMENTS AND FOR MEASURING APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; PROBES AND SENSORS, NAMELY, FOR SCIENTIFIC PURPOSES, IN PARTICULAR PROBES AND SENSORS FOR SCANNING PROBE MICROSCOPES AND FOR MEASURING APPARATUS AND INSTRUMENTS; [COMPUTER HARDWARE AND SOFTWARE, FOR USE IN TRANSMITTING, PROCESSING, EDITING, AND ANALYSING OF DATA IN THE FIELD OF SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES; COMPUTER PROGRAMS, NAMELY, COMPUTER PROGRAMS FOR TRANSMITTING, PROCESSING, EDITING, AND ANALYSING OF DATA, AND COMPUTER PROGRAMS FOR CONTROLLING SCIENTIFIC APPARATUS AND INSTRUMENTS;] ELECTRIC AND ELECTRONIC CONTROL DEVICES AND INSTRUMENTS, IN PARTICULAR FOR CONTROLLING SCIENTIFIC APPARATUS AND INSTRUMENTS, NAMELY, MICROSCOPES, IN PARTICULAR SCANNING PROBE MICROSCOPES
