INSPEC Trademark

Materials testing and analysing; calibration services relating to analytical apparatus; installation, maintenance, updating and upgrading of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; installation, maintenance and updating of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software as a service [SaaS] for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design, development and programming of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design and development of computer software for process control in the fields of micro- and nanoscale science and technology; software design for others for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; calibration of processes

Downloadable computer software for remote monitoring and analysis for use in patterning, processing in the fields of micro and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software for monitoring, analysing, controlling and running physical world operations all in the fields of micro- and nanoscale science and technology; computer software for use in remote meter monitoring; measuring, detecting, monitoring and controlling devices; scanning electron microscopes; scanning probe microscopes; apparatus and instruments for scanning probe microscopy; metering software, recognition software, monitoring software, control software, the aforementioned goods for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: metrology; software, for use in the following fields: control of micro structuring and nano structuring systems; software, for use in the following fields: control of lithography systems; software, for use in the following fields: classification in the fields of micro- and nanoscale science and technology; software, for use in the following fields: detection of defects; software, for use in the following fields: process control in the fields of micro- and nanoscale science and technology; software, for use in the following fields: process monitoring in the fields of micro- and nanoscale science and technology; microscopy software; software, for use in relation to the following goods: scanning electron microscopes; software, for use in the following fields: surface structuring; software, for use in the following fields: surface analysis; software, for use in the following fields: material analyzes; automation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; simulation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: monte carlo simulations; simulation software, for use in the following fields: material analyzes; simulation software, for use in the following fields: surface analysis; simulation software, for use in the following fields: scanning electron microscopes; calibration software; measuring sensors; computer hardware for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection