HITS Trademark
Serial Number: 98875892
Trademark Classes
Owner Contact Info
Legal Representation
Correspondence Address
Jeremy P. Oczek Bond, Schoeneck & King, PLLC
200 Delaware Avenue
Buffalo, NY 14202
United States
Trademark Details
Filing Date
November 27, 2024
Registration Date
Not Registered
Published for Opposition
February 3, 2026
Goods & Services
Equipment in the nature of metrology systems consisting of wafer probers, microscopes, nanopositioners for moving the probe cards and electronic components, probe cards, automatic test equipment, and downloadable automation software with computer vision capability, used to test thin film materials, semiconductors, conductors, wafers, and semiconductor chips, namely, chiplets being integrated circuits and advanced packages being multiple semiconductor chips and electronic components being semiconductor wafers, switches, and integrated circuits integrated together