HIDRA VISION Trademark

Imaging apparatus and instruments for recording, transmission, processing and reproduction of images; detection apparatus and instruments, namely, apparatus for detecting defects in semi-conductors and semi-conductor wafers, apparatus for detecting defects in electronic materials and electronic components, optical apparatus for detecting impurities in semi-conductor materials; electronic apparatus and instruments for generating an image of semi-conductors, semi-conductor wafers, electronic materials and electronic components; semi-conductor testing apparatus and instruments for testing or inspecting semi-conductors, semi-conductor wafers, and electronic semi-conductor materials and components therefor; downloadable or recorded computer software, firmware and hardware for use in the generation of an image of semi-conductors, semi-conductor wafers, electronic materials and electronic components; downloadable or recorded computer software, firmware and hardware for use in testing or inspecting semi-conductors, semi-conductor wafers, electronic materials and electronic components; recorded and downloadable media in the nature of CDs, hard drives, USB flash drives , memory cards and SD cards, having recorded thereon data relating to the imaging, testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components; downloadable or recorded computer software, firmware and hardware featuring recorded data for the imaging, testing or inspection of semiconductors, semi-conductor wafers, electronic materials and electronic components

Computer services, namely, electronic digital imaging of photographs and videos, not for medical purposes; scientific research by means of remote sensing and earth observation, scientific research by means of remote sensing and earth observation from space; computer services, namely, electronic digital imaging of semi-conductors, semi-conductor wafers, electronic materials and electronic components for testing and quality control inspection purposes; testing or inspection of semi-conductors, semi-conductor wafers, electronic materials and electronic components for quality control purposes; material testing for fault detection; technical consulting in the field of pollution detection; soil testing services; quality control of building materials; monitoring of commercial and industrial sites for detection of volatile and non-volatile organic compounds; technical consultancy in the field of pollution detection; inspection services, namely, detection of leaks and draughts within buildings

Treatment of semiconductor materials; treatment of waste semiconductor materials; treatment of electronic materials for the manufacture of semi-conductors, semi-conductor wafers, electronic components; treatment of optical materials for the manufacture of semi-conductors, semi-conductor wafers, electronic components; treatment of integrated circuit packaging materials; treatment of nanostructured materials by laser beam; treatment of materials using a quantum field accelerator/generator; treatment of engineering materials by laser beam; treatment of wafer surfaces by laser beam; treatment of lithography masks; treatment of wafer bulk materials via doping, annealing, planarization, bonding and other fabrication processes; treatment of hazardous waste materials; treatment of thin and fragile materials in the nature of semi-conductors, semiconductor packaging materials, thin-film coatings and electronic components; consultancy relating to treatment of hazardous materials, waste water treatment for the clearance of pollution

Bomb detection services; security threat analysis in the nature of camouflage detection for protecting personal safety