TrademarkDir
EXCELLENCE IN NANOMETROLOGY
DEAD

Serial Number

77245031

Owner

PARK SYSTEMS CORP.

Attorney

Frederick Kim

First Use Date

Apr 6, 2007

Filing Date

Aug 2, 2007

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EXCELLENCE IN NANOMETROLOGY Trademark

Serial Number: 77245031 • Registration: 3451584

EXCELLENCE IN NANOMETROLOGY is a trademark filed by PARK SYSTEMS CORP. on August 2, 2007. The trademark is classified under Class 9 (Computers & Electronics). The application is currently no longer active.

Owner Contact Info

PARK SYSTEMS CORP. (7 trademarks)

KANC 4F, LUI-DONG 906-10
SUWON 443-766 , KR

Entity Type: 03

Trademark Details

Filing Date

August 2, 2007

Registration Date

June 17, 2008

First Use Anywhere

April 6, 2007

First Use in Commerce

April 6, 2007

Cancellation Date

January 23, 2015

Goods & Services

instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes

Filing History

CANCELLED SEC. 8 (6-YR)
Jan 23, 2015 C8..
REGISTERED-SUPPLEMENTAL REGISTER
Jun 17, 2008 R.SR
LAW OFFICE PUBLICATION REVIEW COMPLETED
May 13, 2008 PREV
ASSIGNED TO LIE
May 13, 2008 ALIE
APPROVED FOR REGISTRATION SUPPLEMENTAL REGISTER
May 13, 2008 CNTA
TEAS/EMAIL CORRESPONDENCE ENTERED
May 7, 2008 TEME
CORRESPONDENCE RECEIVED IN LAW OFFICE
May 7, 2008 CRFA
TEAS RESPONSE TO OFFICE ACTION RECEIVED
May 7, 2008 TROA
NON-FINAL ACTION MAILED
Nov 8, 2007 CNRT
NON-FINAL ACTION WRITTEN
Nov 8, 2007 CNRT
ASSIGNED TO EXAMINER
Nov 8, 2007 DOCK
NEW APPLICATION ENTERED
Aug 6, 2007 NWAP

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