DR.WAFER Trademark

Machines and instruments used for measuring and testing semiconductor manufacturing machines, namely, electronic and optical sensors and testing equipment for testing and monitoring manufacturing parameters within semiconductor manufacturing machines; Electronic monitoring devices to collect operational data and settings, including temperature data and settings, from semiconductor manufacturing machines and to ensure proper functioning; component parts and fittings of machines and instruments used for measuring and testing semiconductor manufacturing machines, namely, component parts and fittings of electronic and optical sensors and testing equipment for testing and monitoring manufacturing parameters within semiconductor manufacturing machines; component parts and fittings of machines and instruments used for measuring and testing semiconductor manufacturing machines, namely, electronic monitoring devices to collect operational data and settings, including temperature data and settings, from semiconductor manufacturing machines; management devices used for measuring, monitoring and controlling semiconductor manufacturing machines, namely, electronic devices, namely, computer management devices used for monitoring or notifying a user about the operation status of semiconductor manufacturing machines; management devices used for measuring, monitoring and controlling semiconductor manufacturing machines, namely, electronic devices, namely, computer management devices used for monitoring or notifying a peripheral device about the operation status of semiconductor manufacturing machines; component parts management devices used for measuring, monitoring and controlling semiconductor manufacturing machines and fittings thereof, namely, optical sensors for detecting condition defects and measuring the compacity of semiconductor manufacture machines; remote control telemetering apparatus; precision instruments in the nature of length measuring gauges; precision instruments for manipulation and positioning of microscopic objects; monitoring apparatus, other than for medical purposes, namely, monitoring device used for monitoring operation functioning status of semiconductor manufacturing machines; automatic temperature, flow, pressure, and oxygen regulators for measuring and analyzing the condition of semiconductor wafers and to ensure proper functioning in semiconductor manufacturing machines