B Trademark

Computers; downloadable computer programs for monitoring and analyzing optical inspection workflows in semiconductor wafer inspection; recorded computer programs for image acquisition, focus calibration, and defect signal processing in semiconductor optical inspection systems; computer operating programs, recorded; downloadable computer software for defect recognition, critical dimension measurement, and pattern overlay analysis; downloadable computer software applications for configuring optical parameters and real-time system control, synchronization, and diagnostics in inspection systems; apparatus for physics, namely, vacuum-compatible optical sensors and beam diagnostics modules used in advanced process nodes in semiconductors; instruments for physics, namely, spectrometers, photon detectors, and image sensors for nanometer-scale defect detection; optical mirrors; optical glasses; computer workstation comprising of processing units, memory, high-speed data buses, optical sensor interfaces, and wafer inspection system control; image transfer apparatus, namely, optical relay modules for transferring inspection images from the lens to a sensor; wafers for integrated circuits; semiconductor devices; semiconductors; IC substrates, namely, plates used in advanced photomask and inspection tooling; precision measuring apparatus, namely, optical-based measurement modules for defect inspection; ultraviolet detectors; automatic optical detectors for detecting phase-shift patterns, sub-resolution bridging, and particulate contamination on semiconductor wafers; apparatus for physics, namely, sensors for determining wafer alignment, position, orientation, and defect inspection; instruments for physics, namely, silicon photodiode detectors and stage sensors; optical sensors

Consultancy in the design and development of computer hardware; computer programming services for data processing; software engineering services for data processing; providing scientific research and development in the field of optical inspection and defect detection; industrial analysis and research services in the field of semiconductor optical inspection for advanced process nodes; research and development of new products for others