AUTO MAP X-Y-Z MEASUREMENT ANALYSIS PROGRAM Trademark

Serial Number: 74284413

AUTO MAP X-Y-Z MEASUREMENT ANALYSIS PROGRAM is a trademark filed by RAM OPTICAL INSTRUMENTATION, INC. on June 15, 1992. The trademark is classified under Class 9 (Computers & Electronics). The application is currently no longer active.

Trademark Classes

Class 9 - Computers & Electronics

Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments

Owner Contact Info

RAM OPTICAL INSTRUMENTATION, INC. (2 trademarks)

1175 North St
Rochester, NY 14580

Entity Type: 03

Legal Representation

Attorney of Record

Robert E. Strauss

108 trademarks filed View all →

Trademark Details

Filing Date

June 15, 1992

Registration Date

Not Registered

First Use Anywhere

August 27, 1991

First Use in Commerce

August 27, 1991

Published for Opposition

July 13, 1993

Goods & Services

computer software and user manuals sold therewith for a measurement analysis program for use with optical measurement inspection systems for precision measurement with video probes