Serial Number
79357324
Owner
SPECS Surface Nano Analysis GmbHAttorney
Leo M. LoughlinFiling Date
Oct 25, 2022
ASTRAIOS Trademark
Serial Number: 79357324 • Registration: 7369604
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 41 - Education & Entertainment
Education; providing of training; entertainment; sporting and cultural activities
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Legal Representation
Correspondence Address
Leo M. Loughlin Rothwell, Figg, Ernst & Manbeck, PC
901 New York Avenue, N.W.
Suite 900 East
Washington, DC 20001
UNITED STATES
Trademark Details
Filing Date
October 25, 2022
Registration Date
April 30, 2024
Published for Opposition
February 13, 2024
Goods & Services
Educational services, namely, providing classes in the field of handling and operating scientific apparatus and instruments, in particular electron spectrometers; arranging and conducting of seminars and workshops in the field of handling and operating scientific apparatus and instruments, in particular electron spectrometers; training advice, namely, providing advice about education in the field of handling and operating scientific apparatus and instruments, in particular electron spectrometers
Scientific apparatus and instruments, in particular for electron spectroscopy, ion spectroscopy and gas and elemental analysis, namely, spectroscopes; measuring apparatus and instruments for material analysis in the nature of spectrometers and microscopes which use methods for spectroscopy and microscopy based on electrons, ions and photons; electrical devices as excitation sources, in particular electron tubes, lasers for non-medical purposes, pulse generators for testing electric current, optical lamps and light emitting diodes, with ultraviolet light, x-rays and electrons, in particular for use in scientific apparatus and instruments; probes and electronic sensors, in particular for scientific purposes, in particular probes and electronic sensors for electron spectroscopy and gas analysis and for measuring apparatus and instruments, in particular for measuring electron and gas concentration; computer hardware and downloadable and recorded software for data processing; computer programs, in particular downloadable and recorded computer programs for transmitting, processing, editing, and analysing of data, and downloadable and recorded computer programs for controlling scientific apparatus and instruments; electric and electronic control devices and instruments, in particular electronic controllers for controlling scientific apparatus and instruments, in particular spectroscopes for electron spectroscopy, ion spectroscopy and gas and elemental analysis
Scientific and technological services and research and design relating thereto being scientific research; technology research in the field of handling and operating spectrometers; research in the field of semiconductor processing technology; industrial analysis and research services, namely, industrial research in the field of spectrometers and surfaces of materials; design and development of computer hardware and software, in particular design and development of computer hardware and software for transmitting, processing, editing, and analysing of data, and design and development of computer programs for controlling scientific apparatus and instruments; updating of computer software, in particular updating of computer software for transmitting, processing, editing, and analysing of data and updating of computer software for controlling scientific apparatus and instruments; services in the field of engineering and in the field of physics, namely, engineering services, physics research; engineering services, namely, technical project planning and design engineering of systems and lines for the processing and analyzing of materials and semiconductor devices; all aforementioned services only for the areas of surface analysis and material characterization