AIMESS Trademark
Serial Number: 79153808 • Registration: 4910714
Trademark Classes
Class 9 - Computers & Electronics
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Class 37 - Building & Construction
Building construction; repair; installation services
Class 42 - Computer & Scientific
Scientific and technological services; industrial analysis and research services
Owner Contact Info
Legal Representation
Correspondence Address
Michael J. Leonard Fox Rothschild LLP
997 Lenox Drive, Bldg. 3
Lawrenceville, NJ 08648-2311
UNITED STATES
Trademark Details
Filing Date
July 17, 2014
Registration Date
March 8, 2016
Published for Opposition
December 22, 2015
Cancellation Date
July 17, 2024
Goods & Services
Industrial measuring systems consisting of infrared and laser-based apparatus for digitizing and measuring physical objects and their properties, including physical parameters, size, depth, diameter, dimensions, gaps, flushness, holes, fasteners, scratches, wear and damage; physical parameter measuring and testing apparatus in the nature of gauges for measuring length, micrometer, thickness and dimension, and infrared and laser-based apparatus for digitizing and measuring physical objects and their properties; systems for dimensional metrology, consisting of optical frequency metrology devices for production machines and automats; test specimen consisting primarily of a calibration device for calibrating and testing infrared and laser-based systems used for digitizing and measuring physical objects and their properties; computer software in the field of metrology, other than in the field of coordinate metrology, namely computer software for use in the digitization, measurement and recordation of physical objects and their properties
Maintenance and repair of measuring, testing and monitoring apparatus and systems
Engineering services; design, development and updating of computer software in the field of metrology, excluding the field of coordinate metrology; development of systems and apparatus for metrology; research and development relating to metrology; consultancy in the field of metrology
