ACCRETECH
DEAD

Serial Number

76182002

Owner

Kabushiki Kaisha Tokyo Seimitsu

Attorney

Curtis B. Hamre

Filing Date

Dec 15, 2000

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ACCRETECH Trademark

Serial Number: 76182002

ACCRETECH is a trademark filed by Kabushiki Kaisha Tokyo Seimitsu on December 15, 2000. The trademark is classified under Class 36 (Insurance & Financial), Class 37 (Building & Construction), Class 40 (Treatment & Processing). The application is currently no longer active.

Owner Contact Info

Kabushiki Kaisha Tokyo Seimitsu (15 trademarks)

9-7-1, Shimorenjaku
Mitaka-shi, Tokyo , JP

Entity Type: 03

Trademark Details

Filing Date

December 15, 2000

Registration Date

Not Registered

Published for Opposition

January 28, 2003

Goods & Services

Rental of manufacturing apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Rental of measuring apparatus, namely-- Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines

Repair and maintenance service for manufacturing and measuring apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines

Brokerage of manufacturing and measuring apparatus, namely-- Metal working machines and tools, namely grinding machines, metal cutting machines; Chemical machines/apparatus, namely semiconductor wafer drying machines, semiconductor wafer scrubbing and washing machine; Semiconductor manufacturing equipment, namely wire slicing machine, wafer slicing machine, slicing machines for non-silicon wafers, sliced wafer carbon demounting and cleaning machine, wafer edge grinding machine, wafer probing machine, wafer dicing machine, dicing machine, chemical mechanical planarizers, and chemical mechanical grinders and back grinders; and Precision measuring machines and instruments used for production of semiconductor, liquid crystal and electronic components, namely wafer thickness measuring instrument, non-contact flatness measuring instrument, machines control gage, automatic measuring machine, displacement sensor, electric micrometer, pneumatic micrometer, digital length measuring instrument, laser interference length measuring sensor, optical fiber laser interferometer measuring unit, surface texture measuring instrument, three-dimensional measuring instrument, surface texture and contour measuring instrument, contour measuring instrument, roundness measuring instrument, roundness and cylindrical/flat profile analysis unit, coordinate measuring machines; data processing machines for use in processing coordinate measuring data; Computer controlled discrete device tester; automatic die selector, namely computerized equipment for testing semiconductors and for selection of dies for semiconductor manufacture; Wafer inspection units; Electric or magnetic measuring machines/instruments, namely electric current or voltage detectors, magnetic measuring apparatus namely magnetic sensors, capacity measures; Optical apparatus/instruments, namely microscopes; Electronic machines/instruments and their parts/fittings, namely ultrasonic depth sounders; Automatic distribution vending machines

Filing History

ABANDONMENT NOTICE MAILED - NO USE STATEMENT FILED
Jun 27, 2006 MAB6
ABANDONMENT - NO USE STATEMENT FILED
Jun 27, 2006 ABN6
SOU EXTENSION 5 GRANTED
Sep 8, 2005 EX5G
SOU EXTENSION 5 FILED
Sep 8, 2005 EXT5
SOU TEAS EXTENSION RECEIVED
Sep 8, 2005 EEXT
SOU EXTENSION 4 GRANTED
Mar 18, 2005 EX4G
SOU EXTENSION 4 FILED
Feb 28, 2005 EXT4
SOU TEAS EXTENSION RECEIVED
Feb 28, 2005 EEXT
SOU EXTENSION 3 GRANTED
Oct 29, 2004 EX3G
SOU EXTENSION 3 FILED
Oct 20, 2004 EXT3
SOU TEAS EXTENSION RECEIVED
Oct 20, 2004 EEXT
CASE FILE IN TICRS
Aug 11, 2004 CFIT
SOU EXTENSION 2 GRANTED
May 4, 2004 EX2G
DIVISIONAL PROCESSING COMPLETE
May 4, 2004 DPCC
ASSIGNED TO EXAMINER
Apr 26, 2004 DOCK
DIVISIONAL REQUEST RECEIVED
Apr 23, 2004 DRRR
PAPER RECEIVED
Apr 23, 2004 MAIL
SOU EXTENSION 2 FILED
Apr 20, 2004 EXT2
SOU EXTENSION 1 GRANTED
Nov 10, 2003 EX1G
SOU EXTENSION 1 FILED
Oct 14, 2003 EXT1
PAPER RECEIVED
Oct 14, 2003 MAIL
NOA MAILED - SOU REQUIRED FROM APPLICANT
Apr 22, 2003 NOAM
PUBLISHED FOR OPPOSITION
Jan 28, 2003 PUBO
NOTICE OF PUBLICATION
Jan 8, 2003 NPUB
APPROVED FOR PUB - PRINCIPAL REGISTER
Nov 25, 2002 CNSA
CORRESPONDENCE RECEIVED IN LAW OFFICE
Jul 15, 2002 CRFA
PAPER RECEIVED
Jul 15, 2002 MAIL
FINAL REFUSAL MAILED
Feb 5, 2002 CNFR
CORRESPONDENCE RECEIVED IN LAW OFFICE
Oct 11, 2001 CRFA
NON-FINAL ACTION MAILED
Apr 11, 2001 CNRT
ASSIGNED TO EXAMINER
Mar 29, 2001 DOCK