Structural Integrity Technologies Inc. – Trademark Portfolio
Entity Type: 03
Structural Integrity Technologies Inc. holds 2 U.S. trademarks filed with the United States Patent and Trademark Office (USPTO), with a strong focus on Class 9 (Computers & Electronics) — 1 filings in this category. The portfolio also extends into Class 7 (Machinery) across 2 Nice Classification classes. Currently, 2 trademarks are registered. Notable registered marks include ULTRAMARS and ULTRAPEEN. The owner is based in Markham, Ontario.
80 Esna Park Drive, Unit #8
Markham, Ontario L3R2R7 , CA
Showing of trademarks Trademarks
Trademark Classifications
Structural Integrity Technologies Inc.'s trademark portfolio spans 2 Nice Classification classes, reflecting the scope of goods and services protected under their brand portfolio.
Scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments
Frequently Asked Questions
How many trademarks does Structural Integrity Technologies Inc. have?
Structural Integrity Technologies Inc. has 2 U.S. trademarks filed with the USPTO. Of these, 2 registered.
What trademark classes does Structural Integrity Technologies Inc. file in?
Structural Integrity Technologies Inc. files trademarks across 2 Nice Classification classes. The most active classes are Class 9 (Computers & Electronics), Class 7 (Machinery). Class 9 covers scientific, nautical, surveying, photographic, cinematographic, optical apparatus and instruments.
What are Structural Integrity Technologies Inc.'s most well-known trademarks?
Structural Integrity Technologies Inc.'s registered trademark portfolio includes well-known marks such as ULTRAMARS and ULTRAPEEN. These are among 2 currently registered trademarks in the portfolio.
What is Structural Integrity Technologies Inc.'s trademark registration success rate?
Structural Integrity Technologies Inc. has a 100% trademark registration rate, with 2 out of 2 resolved applications resulting in successful registration. Currently, 0 applications are pending review.